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Hoshi, Yoshiyuki; Kume, Etsuo
JAERI-Data/Code 2005-010, 48 Pages, 2005/09
JAERI-Data-Code-2005-010.pdf:8.7MB
In scientific and engineering calculations, recently, computational sizes and amounts of calculated results have been increased rapidly due to speedup of computers and increase in memory size. Post processing or visualization of a huge amount of numerical data plays a very important role for understanding the meaning of the data. Computational loads for visualization of large-scale data are still heavy even for graphic computers. Processing speeds for visualization of large-scale data are measured using general-purpose visualization software on graphic computers in JAERI. A guideline is summarized in this report to choose appropriate graphic computers according to the size of the data.
Masuko, Kenji*; Watanabe, Ritsuko; Kume, Etsuo
JAERI-Data/Code 2004-005, 72 Pages, 2004/03
JAERI-Data-Code-2004-005.pdf:10.48MB
no abstracts in English
Miyazaki, Mikiya*
JAERI-Tech 2004-038, 38 Pages, 2004/02
JAERI-Tech-2004-038.pdf:7.04MB
The data display work of visualization is done in many research fields, and a lot of special softwares for the specific purposes exist today. But such softwares have an interface to only a small number of solvers. In many simulations, data conversion for visualization software is required between analysis and visualization for the practical use. This report describes the equipment work of the data visualization environment where AVS/Express was installed in corresponding to many requests from the users of the large-scale structural analysis system which is prepared as an ITBL community software. This environment enables to use the ITBL visualization server as a visualization device after the computation on the ITBL computer. Moreover, a lot of use will be expected within the community in the ITBL environment by merging it into ITBL/AVS environment in the future.
Kato, Katsumi*; Kume, Etsuo
JAERI-Data/Code 2002-019, 116 Pages, 2002/09
JAERI-Data-Code-2002-019.pdf:26.15MB
no abstracts in English
Kato, Katsumi*; Watanabe, Tadashi; Kume, Etsuo
JAERI-Tech 2000-077, 50 Pages, 2001/01
JAERI-Tech-2000-077.pdf:3.62MB
no abstracts in English